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Magazine Name : Ieee Design And Test Of Computers

Year : 2002 Volume number : 19 Issue: 03

What Is Infractructure Ip (Article)
Subject: The 70-Nm Silicon Challenge
Author: Yervant Zorian     
page:      05 - 07
Etm10 Incorporayes Hardware Segment Of Ieee P1500 (Article)
Subject: Hardware Segment
Author: Tersea L Mclaurin      S Ghosh     
page:      08 - 13
A Strategy For Mixed-Signal Yield Improvemennt (Article)
Subject: Random And Systematic Defects , Poor Circuits Isolation
Author: Jim Bordelon      K. Sun     
page:      14 - 23
Embedded Timing Analysis : A Soc Intrastriucture (Article)
Subject: Soc Infrastructure , Highly Accurate Embedded
Author: Sassan Tabatabaei      Andre Ivanov     
page:      214 - 36
Design For Debug: Catching Design Errors In Digital Chips (Article)
Subject: Debug Requirements
Author: Bart Vermeulen      Sandeep Kumar Goel     
page:      37 - 45
Ip For Embedded Diagnosis\ (Article)
Subject: Integrated Bist-Based Flow Streamlines
Author: Stephen Pateras     
page:      46 - 55
Embedded Robustness Ips For Transient -Eror-Free Ics (Article)
Subject: Transient -Error Protection
Author: Eric Dupont      Michael Nicolaidis      L Rohr     
page:      56 - 71
Toward Cad-Ip Reuse: A Web Bookshelf Of Fundamental Algorithms (Article)
Subject: Cad-Ip Reuse , Fundamental Algorithms
Author: Robert J Caldwell      A. B Kahng      I. L. Markov     
page:      72 - 81
Survey Of Low-Power Testing Of Vlsi Circuits (Article)
Subject: Low Power , Vlsi Circuits
Author: Patrick Girard     
page:      82 - 93
Dft And Bist Of A Multichip Module For High-Energy Physics Experiments (Article)
Subject: Dft And Bist Of A Multichip Module
Author: Alfredo Benso      Silvia Chiusano     
page:      94 - 105